S25HS01GTFABHA030 - Cypress Semiconductor

NOR Flash Nor

XC2C256-6VQG100C

Xilinx

CPLD - Complex Programmable Logic Devices XC2C256-6VQG100C
XC2C256-6TQG144C

Xilinx

CPLD - Complex Programmable Logic Devices XC2C256-6TQG144C
XC9536XL-10VQG44C

Xilinx

CPLD - Complex Programmable Logic Devices 3.3V 36-mc CPLD
XC2C32A-6VQG44C

Xilinx

CPLD - Complex Programmable Logic Devices XC2C32A-6VQG44C
XC9572XL-10VQG44C

Xilinx

CPLD - Complex Programmable Logic Devices 3.3V 72-mc CPLD
XC2C64A-7VQG44C

Xilinx

CPLD - Complex Programmable Logic Devices XC2C64A-7VQG44C
XC9572XL-10VQG64C

Xilinx

CPLD - Complex Programmable Logic Devices 3.3V 72-mc CPLD
XC2C64A-7VQG44I

Xilinx

CPLD - Complex Programmable Logic Devices XC2C64A-7VQG44I
SPEAR300-2

STMicroelectronics

Microprocessors - MPU MPU ARM926 Cortex 8-ch DMA 32KB Rom
XC2C512-10FT256I

STMicroelectronics

Embedded - CPLDs (Complex Programmable Logic Devices)

Часть	Производитель	Снабжать	Описание
5615-9-G	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM (3/16 X 9 INCH)
5615-12-G	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM (1/4 X 12 INCH)
3312-PR	Fluke	3,000	Test Probes 5000A, FLEX CT 48 IN
5618B-12-S	Fluke	3,000	Test Probes PROBE, SECON. PRT, 12 X 1/8 INCH OD
5618B-9-S	Fluke	3,000	Test Probes PROBE, SECON. PRT, 9 X 1/8 INCH OD
5618B-6-G	Fluke	3,000	Test Probes PROBE, SECON. PRT, 6 X 1/8 INCH OD
5618B-6-S	Fluke	3,000	Test Probes PROBE, SECON. PRT, 6 X 1/8 INCH OD
5618B-12-G	Fluke	3,000	Test Probes PROBE, SECON. PRT, 12 X 1/8 INCH OD
5618B-9-G	Fluke	3,000	Test Probes PROBE, SECON. PRT, 9 X 1/8 INCH OD
TPSFLEX36-TF-II	Fluke	3,000	Test Probes
5615-9BND-A	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM,9IN 90 DEG BEND
5615-9-S	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM (3/16 X 9 INCH)
5615-12-A	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM (1/4 X 12 INCH)
5615-9BND-B	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM,9IN 90 DEG BEND
5615-9-D	Fluke	3,000	Test Probes PROBE, SECON. PRT, 100 OHM (3/16 X 9 INCH)